Pcb Chat
RM 117: When Residues Cause Circuit Assemblies to Fail
- Autor: Vários
- Narrador: Vários
- Editor: Podcast
- Duración: 0:29:27
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Sinopsis
Eric Camden (lead investigator with Foresite) and Mike Konrad discuss electrochemical migration (ECM) and other failure modes caused by residues on circuit assemblies.
